Certified Scientific Software's spec X-Ray Diffraction and Data Acquisition software provides scientists with reliable instrument control at more than 475 X-ray and neutron diffractometers at over 175 locations worldwide.

Developed in 1986 for X-ray diffraction, spec's portability, flexibility and power have made it a valuable data acquisition tool in a wide range of experiments. spec is available on UNIX/Linux platforms and supports numerous hardware configurations.

spec's features and functionality reflect years of input from a broad user base. Unlike typical home-grown or public-domain software, spec is well-documented and backed by committed support.

Included with spec (and also available separately) is the C-PLOT Scientific Graphics and Data Analysis package. Together, these programs can take you from instrument control and data acquisition, through data analysis, to preparation of figures for publication.